||<tablewidth="98%"35%  style="border-width:0px;border-bottom-width:0px;vertical-align:top;text-align:right;color:#BDB76B; ">''' [[V000/IJS|O Institutu]] <<BR>> [[V001/IJS|ijs.si/novice]]''' ||[[Raziskovalni odseki]]<<BR>>[[Centri]]<<BR>>[[Službe in podporne dejavnosti]]<<BR>><<BR>> ||


||<tablewidth="98%"35%  style="border-width:0px;vertical-align:top;text-align:right;font-size:85%;line-height:150%;color:#606060; "> {{attachment:cemm_logo.jpg}} <<BR>><<BR>> ''' Center for Electron Microscopy and Microanalysis (CEMM) is JSI infrastructure unit which comprises analytical equipment for various electron microscopy techniques that are necessary for R&D work of JSI departments. Access to the CEMM equipment is also available to other research institutions and universities.  <<BR>><<BR>> Users of CEMM research equipment are those graduate students and researchers who are interested in comprehensive structural and chemical characterization of materials on micro-, nano- and atomic scale with a number of complementary methods of electron microscopy.   '''<<BR>> ||<65% bgcolor="#" style="border-width:0px;text-align:left;color:#404040;vertical-align:top;BORDER-LEFT-WIDTH:2px"><<Include(/Desno)>><<BR>> ||


||<tablewidth="98%"style="border-width:0px;BORDER-top-WIDTH:1px;text-align:center;color:#000000;">~-Institut "Jožef Stefan", Jamova 39, 1000 Ljubljana, Slovenija, Telefon: (01) 477 39 00, Faks.: (01) 251 93 85<<BR>> info@ijs.si  -~ ||